| ▲ | codingpanic 12 hours ago | |||||||
I've been wondering how long before RAM is fabbed on die to get around supply issues. This is one of the first I've read of so far. How long before Apple releases a CPU with ram on die? | ||||||||
| ▲ | Rohansi 11 hours ago | parent | next [-] | |||||||
They're typically manufactured with very different processes so one has to wonder what compromises are being made here to get both on the same die. | ||||||||
| ▲ | minkowsky 12 hours ago | parent | prev [-] | |||||||
Author here. The supply angle is exactly the motivation — HBM is the hardest part to get and ~26% of an AI rack's BOM. First, separate three things people lump together. Apple already does memory on package (M-series unified memory = LPDDR5X dies next to the SoC). The near-term industry path is bonded stacking (AMD 3D V-cache, HBM4's logic base die). What we're doing is monolithic — growing the memory on top of finished logic. Three reasons that distinction matters: 1. Bonding only helps at the margin. A hybrid-bond interface still carries a relatively large interconnect capacitance in um scale, so at memory bandwidth the I/O drivers crossing it dissipate most of the power and overheat — you move the memory closer without escaping the I/O energy. Monolithic inter-tier vias are nano-scale (we model ~1% the interconnect energy of a bonded interface), and that's the only thing that actually moves the needle. 2. 2D-TMDs are the only functional CMOS you can build in the BEOL. Monolithic 3D means fabricating the upper tiers after the logic, at ≤450 °C, or you cook everything underneath. Silicon needs ~1000 °C; low-temp oxide semiconductors (IGZO) are n-type only, so no real CMOS. 2D-TMDs give both n- and p-type at BEOL temperature. Nothing else does. 3. ~6 orders of magnitude lower off-current (~1 fA/µm) finally makes a capacitor-free cell work. Conventional 1T1C DRAM needs a big storage capacitor — the deep-trench / high-aspect-ratio etch you can't do in the BEOL anyway. A 2T0C gain cell holds charge on a transistor gate with no capacitor; in silicon it leaked away in microseconds, so it was never usable. With 2D-TMD leakage you get ~1.8 s retention — refresh at ~1 Hz and drop the capacitor, and the trench, entirely. | ||||||||
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