| ▲ | zoenolan an hour ago | |
I thought the article was going to be about how people scan chips Rapid Chip Reverse Engineering Using Laser, Focused ion beams, and Scanning electron microscope https://academic.oup.com/mam/article/30/Supplement_1/ozae044... FIBs are also used to test modifications before doing a respin. I'm still in awe that matter can be manipulated so precisely | ||