Honestly, I’m not sure either. I can’t find anybody who actually went through the trouble of testing port/cable durability over many cycles.

I can personally speak to the seeming reliability of the springs on lightening, but thats anecdotal and would only apply to devices I’ve interacted with. Truthfully USB-C has been almost as reliable (only seen 2-3 ports with issues over literally hundreds, vs the 0 for lightning over a smaller sample).

I guess at some point the argument is moot, but I do like digging lint out of USB-C connectors a lot less- it is a lot more worrying to do.