Skimming through the linked paper, I can't actually find that claim being backed up anywhere?

The abstract does indeed say "It was found that the system reliability decreases to 0.84 after 1·10^8s at a stressing temperature of 300K", but I can't find anything close to that in the sections about Bias Temperature Instability or Hot Carrier Injection.

The only thing which to me looks close is the rather acute failure in the Radiation Trapping section - but that also states that the failure mode is dependent more on the total dose than time, and the total dose at which it fails is somewhere between 126 krad - 1.26 Mrad. For reference, a dose of 1 krad is universally fatal to a human.

In other words: don't put unshielded DRAM in a nuclear reactor?

I included the page number with the link, to prevent this, and also noted that these were modeled failures. I had trouble finding any real world data, which is where the google comment came in.