| ▲ | ChrisMarshallNY 7 days ago | |
I do both. I like to develop designs in my head, and there’s a lot of trial and error. I think the results are excellent, but I can hit a lot of dead ends, on the way. I just spent several days, trying out all sorts of approaches to PassKeys/WebAuthn. I finally settled on an approach that I think will work great. I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary. | ||
| ▲ | rablackburn 7 days ago | parent [-] | |
> I have found that the old-fashioned “measure twice, cut once” approach is highly destructive. It was how I was trained, so walking away from it was scary. To be fair it’s great advice when you’re dealing with atoms. Mutable patterns of electrons, not so much (: | ||